Scanning Electron Microscopy and X-Ray Microanalysis

des pages: :
Évaluation: :
ISBN: : 0-306-47292-9
Type de format: : fb2, ibooks, azw, odf, epub, lit, pdf, mobi, cbt
Prix: : FREE
Auteure: : Joseph Goldstein,,
Les données: : 01/01/2003
EAN: : 9780306472923

Découvrez Scanning Electron Microscopy and X-Ray Microanalysis le livre de Joseph Goldstein sur streetzen.net - 3ème libraire sur Internet avec 1 million de livres . Scanning Electron Microscopy And X-Ray Microanalysis a prix bas: retrouvez tous les produits disponibles a l achat sur Rakuten. Scanning Electron Microscopy and X-Ray Microanalysis de Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin;.This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysisAuthor: Joseph I. Goldstein. Comparable to reflected-light optical microscopy, SEM is a method to image surfaces of a sample. In the years –38, the German physicist and inventor Manfred von Ardenne constructed an instrument that allowed the generation of magnified images of a sample by scanning the surface using an electron beam (the electron probe) in a line-by-line streetzen.net: Sven Henning, Rameshwar Adhikari. Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Kindle edition by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael. Download it once and read it on your Kindle device, PC, phones or tablets. Use features like bookmarks, note taking and highlighting while reading Scanning Electron Microscopy and X /5(20).


Scanning Electron Microscopy and X-Ray Microanalysis